Analog testing using Zero-crossing technique

摘要

The Functional digital testing is defined as a black and white test [1,2] by other words, it can determine faulty & non faulty boards. But the analog faults are not. The faulty & non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on Zero-Crossing technique to evaluate the faulty circuits. The effect of tolerance from 0 to ±20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method.