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Energy Relaxation Time and Microwave Noise in InAs/AISb/GaSb/GaAs Heterostructures

机译:INAS / AISB / GASB / GAAs异质结构中的能量松弛时间和微波噪声

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摘要

Experimental technique based on microwave noise measurements is used to evaluate energy dissipation by hot electrons in a typeⅡheterostructure consisting of InAs and GaSb with a thin AlSb barrier layer between them and containing a two-dimensional electron gas (2DEG). The energy relaxation time is estimated at 80 K and 300 K lattice temperatures. The energy relaxation time is almost independent of electric field and lattice temperature.
机译:基于微波噪声测量的实验技术用于评估由InAs和Gasb组成的Ⅱ型高位结构中的热电子的能量耗散,它们在它们之间具有薄的Alsb阻挡层并包含二维电子气体(2deg)。能量弛豫时间估计为80 k和300克格的晶格温度。能量松弛时间几乎与电场和晶格温度无关。

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