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Embedded-software-based approach to testing crosstalk-induced faults at on-chip buses

机译:基于软件的嵌入式软件方法来测试芯片诱导的芯片公交车的故障

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Crosstalk effects on long interconnects are becoming significant for high-speed circuits. This paper addresses the problem of testing crosstalk-induced faults at on-chip buses in system-on-a-chip (SOC) designs. We propose a method to self-test on-chip buses at-speed, by executing an automatically synthesized program using on-chip processor cores. The test program, executed at system operational speed, can activate and capture the worst-case crosstalk effects on buses and achieve a complete coverage of crosstalk- induced logical and delay faults. This paper discusses the method and the framework for synthesizing such a test program. Based on the bus protocol, the instruction set architecture of an on-chip processor core, and the system specification, the method generates deterministic tests in the form of instruction sequences. The synthesized test program is highly modularized and compact. The experimental results show that, for testing interconnects between a processor core and any other on-chip core, a 3K-byte program is sufficient to achieve the complete coverage for crosstalk- induced logical and de lay faults.
机译:对于高速电路,长互连的串扰效应变得巨大。本文介绍了在芯片系统(SOC)设计中在片上总线上测试串扰引起的故障的问题。通过使用片上处理器核心执行自动合成的程序,我们提出了一种在芯片上进行自测的片上总线的方法。在系统运行速度下执行的测试程序可以激活和捕获对公共汽车的最坏情况串扰效果,并实现串扰引起的逻辑和延迟故障的完整覆盖范围。本文讨论了合成此类测试程序的方法和框架。基于总线协议,片上处理器核心的指令集架构,以及系统规范,方法以指令序列的形式生成确定性测试。合成的测试程序高度模块化和紧凑。实验结果表明,为了测试处理器核心与任何其他片上核心之间的互连,3K字节程序足以实现串扰引起的逻辑和DE故障的完全覆盖。

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