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NEW METHOD FOR MEASURING THE SIZE-OF-SOURCE EFFECT IN STANDARD RADIATION THERMOMETRY

机译:标准辐射温度测量源极效应的新方法

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For temperature measurement by a pyrometer, utilising the heat radiation of the measured object, the component of the measurement uncertainty depending mainly on the source size and called "size-of-source effect" (SSE), is one of the most insidious and difficultly determined properties of the radiation thermometer. This effect is caused by additional radiation reaching the detector of the radiation thermometer not by the usual way in accordance with geometric optics, but by scattering of radiation on defects of the lenses or mirrors, incident from peripheral zones of the object, by diffraction on apertures and interference of reflections on surfaces of the optical elements. For the ideal optics such radiation deviates from the sensing surface of the photodetector or, generally, is cut off by the field diaphragm in a plane of an intermediate image of the measured object. To solve the problem of the determination of the SSE in the real conditions of measurement standard work, the method of measurement with a specially designed device was developed and tested: the blackbody is replaced by a cooled simulator of a target viewed by the radiation thermometer,. The essence of the method is, that in the furnace, heated up to the reference temperature, measurements of the brightness of the cooled simulator target are carried out. In this case, if the cooling of the target simulator is sufficient, its radiation will only be caused by reflection of radiation from the heated cartridge ahead. This radiation can be calculated for known sizes and reflectance of the simulator sheet surface. The parasitic radiation causing SSE reaches the radiation thermometer precisely in the same way as with the blackbody in a crucible at reference temperature, and it can be observed.
机译:通过高温计测量的温度测量,利用测量物体的热辐射,测量不确定性的组成部分主要取决于源大小并称为“源极效应”(SSE),是最隐蔽的且难以实现的确定辐射温度计的性能。这种效果是由额外的辐射引起的辐射温度计的额外辐射而不是根据几何光学器件的常用方式引起的,而是通过散射在物体的外围区域入射的透镜或镜子的缺陷辐射,通过孔对孔径散射反射对光学元件表面的反射干扰。对于理想的光学器件,这种辐射偏离光电探测器的感测表面,或者通常,在测量物体的中间图像的平面中,由场膜切断。为了解决在测量标准工作的真实条件下确定SSE的确定,开发并测试了用专门设计的装置测量方法:黑体被辐射温度计观察的目标的冷却模拟器代替, 。该方法的本质是,在炉中加热到参考温度,进行冷却模拟器目标的亮度测量。在这种情况下,如果目标模拟器的冷却足够,则其辐射仅是通过从前方加热盒的辐射反射而引起的。该辐射可以针对模拟器片表面的已知尺寸和反射率来计算。导致SSE的寄生辐射精确地以与参考温度坩埚中的黑体相同的方式,并且可以观察到相同的方式。

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