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Gap States at the Interface of Ultra-Thin Oxide and Organic Films on Si(100)

机译:在Si(100)上的超薄氧化物和有机膜的界面处的间隙状态

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The formation of gap states during the initial oxidation of Si(100)-2xl and the adsorption of maleic anhydride on Si(100)-2xl at room temperature have been followed with photoluminescence measurements and high resolution electron energy loss spectroscopy. We observe that gap states are already induced after the adsorption of 0.002 L of molecular oxygen on Si(100)-2xl. Prolonged exposures to molecular oxygen results in a marked increase of the gap state density. In contrast, repeated cycles of water adsorption and heating to 530°C leads to a thicker oxide film, which exhibits a reduced gap state density. The adsorption of the unsaturated organic molecule maleic anhydride on Si(100)-2xl does not induce the formation of gap states.
机译:通过光致发光测量和高分辨率电子能量损失光谱,在Si(100)-2XL的初始氧化过程中形成间隙状态和在室温下的马来酸酐对Si(100)-2XL的吸附。我们观察到在Si(100)-2x1上吸附0.002L的分子氧后,已经诱导了间隙状态。延长曝光的分子氧导致间隙状态密度的显着增加。相反,反复循环的水吸附和加热至530℃导致较厚的氧化物膜,其表现出降低的间隙状态密度。不饱和有机分子马来酸酐对Si(100)-2XL的吸附不会诱导间隙状态的形成。

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