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Industrial Application of Surface and Interface Analysis. Thickness Measurement of Ultra-thin Si Oxide Films by ESCA.

机译：表面和界面分析的工业应用。 ESCA的超薄Si氧化膜厚度测量。

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Seiichi Iwata;
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年度 1991
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8. DENSITY AND SURFACE TENSION MEASUREMENTS ON AQUEOUS SOLUTIONS OF WATER-SOLUBLE NIGROSINE USED IN FILM THICKNESS MEASUREMENTS [R] . J. Aw Crozier, G. F. Hewitt, P. C. Lovegrove 1961

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Industrial Application of Surface and Interface Analysis. Thickness Measurement of Ultra-thin Si Oxide Films by ESCA.

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