SOME PARAMETERS OF NOISE IMMUNITY FOR THE LOW VOLTAGE LOGIC CIRCUITS

摘要

The paper present the general relation for the determination oj the dynamic noise immunity for the interconnection of two digital circuits. There are presented the relations for determination the parameters of the guaranteed and typical noise immunity: the amplitude of the voltage, duration (time), rise and fall time, phase difference, power and energy. For the low voltage logic circuit subfamilies (LV, LVC, LVT, ALVC) was calculated the parameters of guaranteed and typical noise immunity.