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Effects of surface hydrogenation on initial reaction processes of transition-metal adatoms on silicon surfaces

机译:表面氢化对硅表面过渡 - 金属吸附物初始反应过程的影响

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We studied the effects of the surface hydrogenation on the adsorption, penetration, and silicidation, i.e., the initial reaction processes of the transition-metal Ni and Ti adatoms on the Si surfaces by the first-principles theoretical calculations. We found for both Ni and Ti that the surface hydrogenation changes the most stable surface site and reduces the adsorption energy. In addition, it blocks the penetration, and thus prevents the silicidation. Furthermore, we newly propose its interesting effects from our results, i.e., impurity metal atoms existing in the Si subsurface are extracted onto the surface by the surface hydrogenation. Thereby, highly pure and atomically flat Si surfaces are expected to be obtained.
机译:我们研究了表面氢化对吸附,渗透和硅化的影响,即通过第一原理理论计算通过第一原理进行Si表面上的过渡金属Ni和Ti吸附物的初始反应过程。我们发现表面氢化表面氢化表面均匀的表面位点并降低吸附能量。另外,它阻止穿透,从而防止硅化。此外,我们新提出了从我们的结果中的有趣效果,即通过表面氢化将存在于Si地下中存在的杂质金属原子。由此,预期高纯度和原子扁平的Si表面。

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