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首页> 外文期刊>Physical Review, B. Condensed Matter >Effects of surface hydrogenation on initial reaction processes of transition-metal Ni and Ti adatoms on Si(001) surfaces
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Effects of surface hydrogenation on initial reaction processes of transition-metal Ni and Ti adatoms on Si(001) surfaces

机译:表面氢化对Si(001)表面过渡金属Ni和Ti吸附原子初始反应过程的影响

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We studied the effects of the surface hydrogenation on the initial reaction processes of the transition-metal Ni and Ti adatoms on the Si(001) surface by the first-principles theoretical calculations. It was found that both Ni and Ti adsorbed on the bare Si surface are stabilized by penetrating into the subsurface sites, while they do not penetrate into the H-terminated Si subsurface. Their stability in the bare Si subsurface is due to the existence of the dangling-bond charge of the surface Si atoms. We concluded that the surface hydrogenation blocks the penetration of both Ni and Ti, thus preventing the silicidation. Furthermore, it is expected from our results that Ni and Ti in the bare Si subsurface are extracted onto the surface by the surface hydrogenation. [References: 20]
机译:通过第一性原理计算,我们研究了表面氢化对过渡金属Ni和Ti原子在Si(001)表面初始反应过程的影响。发现吸附在裸露的Si表面上的Ni和Ti都通过渗透进入亚表面部位而被稳定,而它们不渗透至H端接的Si亚表面。它们在裸露的Si子表面中的稳定性归因于表面Si原子的悬挂键电荷的存在。我们得出的结论是,表面氢化会阻止Ni和Ti的渗透,从而防止硅化。此外,从我们的结果可以预期,裸露的硅子表面中的Ni和Ti通过表面氢化而被提取到表面上。 [参考:20]

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