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Electrical properties of CdTe:Cl single crystals grown by sublimation technique

机译:CDTE的电性能:通过升华技术生长的CL单晶

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The current-voltage characteristics are investigated in single crystals of CdTe doped with Cl. Measured samples were n-type conductivity with resistivity ρ = (0.5 - 2.0) * 10~8 Ohmxcm, electron concentration n = (0.5 ÷ 2.0) * 10~8 cm~(-3) and electron mobility μ = 280 ÷ 300 cm~2/V * s. Experimental data are explained in the framework of theory of highly doped and highly compensated semiconductors. The mobility-lifetime product measured at room temperature is found to be in the order of (1 ÷ 5) x 10~(-4) cm~2 * V~(-1). It means that this material can be used for manufacture of X-ray detectors.
机译:在用Cl掺杂的CdTe的单晶中研究了电流 - 电压特性。测量的样品是具有电阻率ρ=(0.5-2.0)* 10〜8 OHMXCM,电子浓度n =(0.5±2.0)* 10〜8cm〜(-3)和电子迁移率μ= 280°300厘米的电导率〜2 / v * s。在高掺杂和高度补偿半导体的理论框架中解释了实验数据。发现在室温下测量的迁移寿命产品是(1°5)×10〜(-4)cm〜2 * V〜(-1)的顺序。这意味着该材料可用于制造X射线探测器。

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