首页> 外文会议>International Symposium on Chemical Vapor Deposition >METALORGANIC CHEMICAL VAPOR DEPOSITION OF NICKEL FILMS: INVESTIGATION OF A NEW PRECURSOR, Ni(tmen)(μ-tfa)(tfa)_2(μ-H_2O)
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METALORGANIC CHEMICAL VAPOR DEPOSITION OF NICKEL FILMS: INVESTIGATION OF A NEW PRECURSOR, Ni(tmen)(μ-tfa)(tfa)_2(μ-H_2O)

机译:镍膜的金属化学化学气相沉积:对新前体的研究,Ni(Tmen)(μ-TFA)(TFA) _ 2(μ-H_2O)

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This paper presents results on the synthesis of [Ni(tmen)(μ-tfa)(tfa)]_2(μ-H_2O) and its evaluation as a potential metalorganic precursor for the chemical vapor deposition of Ni films. TG and DSC showed that this compound can be heated at least up to 473K without modification. Films deposited between 498K and 623K have a granular structure whose grain size is a function of the deposition conditions. They are crystallized and are composed of mixtures of Ni and the metastable carbide Ni_3C. The Ni_3C/(Ni_3C+Ni) ratio was determined with XRD after correction of the JCPDS card for Ni_3C. It was found to decrease with increasing temperature up to 573K. The same holds for the overall carbon content and the ratio of (C-Ni)/[(C-C)+(C-Ni)] bonds, determined by EPMA and XPS, respectively. Reflectance measurements confirm these trends.
机译:本文提出了[Ni(Tmen)(μ-TFA)(TFA)] _ 2(μ-H_2O)的合成及其作为Ni膜化学气相沉积的潜在金属有机前体的评价。 Tg和DSC显示,可以在不改性的情况下至少加热该化合物。沉积在498K和623K之间的薄膜具有粒度结构,其粒度是沉积条件的函数。它们是结晶的,并且由Ni和亚稳碳化物Ni_3C的混合物组成。在校正JCPDS卡的NI_3C后,用XRD测定NI_3C /(NI_3C + NI)比。发现随着温度的升高至573k,被发现减少。通过EPMA和XPS确定的总碳含量和(C-NI)/ [(C-C)/ [(C-C)+(C-Ni)]键的比例分别相同。反射率测量确认了这些趋势。

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