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Performance limits of a closed-loop, micro-g silicon accelerometer with deposited rigid electrodes

机译:封闭环的性能限制,带沉积刚性电极的微g硅加速度计

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Silicon micro-g accelerometers are of increasing demand for the new generation of lightweight low cost inertial measurement units (IMUs) and microgravity measurement systems. This paper presents modeling and noise analysis of a closed-loop micro-g accelerometer with deposited sense and feedback electrodes, and direct digital output. Modeling and noise analysis have been essential to identifying the performance limits in addition to design and development of the accelerometer. The paper first briefly reviews the sensor and its interface electronics, followed by the complete time domain modeling and simulation of the closed-loop electromechanical accelerometer. The simulation results show achievement of less than 10 /spl mu/g direct digital output in a /spl plusmn/1 g range, which is equivalent to 17.6 bits dynamic range. Also, the mechanical and electrical noise analysis indicate a noise floor of 0.72 /spl mu/g//spl radic/Hz without vacuum packaging.
机译:硅微G加速度计对新一代轻质低成本惯性测量单元(IMU)和微匍匐测量系统的需求越来越大。本文介绍了具有沉积感和反馈电极的闭环微G加速度计的建模和噪声分析,以及直接数字输出。除了设计和开发加速度计外,建模和噪声分析对于识别性能限制至关重要。本文首先介绍了传感器及其界面电子设备,然后进行了完整的时域建模和闭环机电加速度计的仿真。仿真结果表明,在A / SPL PLUSMN / 1G范围内的直接数字输出的成就少于10 / SPL直接数字输出,相当于17.6位动态范围。而且,机械和电噪声分析表示噪声底板为0.72 / SPL MU / G // SPL Radic / Hz而无真空包装。

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