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The Grand Pareto: A Methodology for Identifying and Quantifying Yield Detractors in a Technology for Volume Semiconductor Manufacturing

机译：Grand Pareto：一种用于在批量半导体制造技术中识别和量化产量折断剂的方法

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《IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop》|2006年||共6页
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Berndlmaier Z.; Winslow J.; Desineni R.; Blauberg A.; Chu B.;
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1. The Grand Pareto: A Methodology for Identifying and Quantifying Yield Detractors in Volume Semiconductor Manufacturing [J] . Desineni R., Berndlmaier Z., Winslow J., IEEE Transactions on Semiconductor Manufacturing . 2007,第2期

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3. IDENTIFYING ILL TOOL COMBINATIONS VIA GIBBS SAMPLER FOR SEMICONDUCTOR MANUFACTURING YIELD DIAGNOSIS [J] . Yu-Chin Hsu, Rong-Huei Chen, Chih-Min Fan Proceedings of the Workshop on Principles of Advanced and Distributed Simulation . 2012,第CDaROM期

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4. The Grand Pareto: A Methodology for Identifying and Quantifying Yield Detractors in a Technology for Volume Semiconductor Manufacturing [C] . Berndlmaier, Z., Winslow, . 2006

机译：大帕累托：在批量半导体制造技术中识别和量化良率下降因素的方法论
5. The Implementation of a Systematic Method for Identifying the Root Causes of Manufacturing Negative Process Yield in a North American Fastener Manufacturing Facility [D] . Venable, Bradley J. 2019

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机译：定量从不合格的体细胞计数牛奶中制造帕马森干酪的奶酪产量降低的量化
7. Clean Technology Supporting Semiconductor Manufacturing Process. The Ultraclean Technology for Semiconductor Manufacturing. [O] . Tadahiro OHMI 1999

机译：清洁技术支持半导体制造工艺。超薄技术为半导体制造。
8. Development of Methodology and Technology for Identifying and Quantifying Emission Products from Open Burning and Open Detonation Thermal Treatment Methods. Field Test Series A, B, and C. Volume 2, Part B. Quality Assurance and Quality Control. Appendices [R] . Johnson, M. 1992

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