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Peculiarities of Raman Spectra and Real Structure of Ge_(1-x)Si_x Solid Solution

机译:拉曼光谱的特性和Ge_(1-x)Si_x固溶解决的实际结构

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The amplitude, shape and position of the Raman spectra lines have been investigated versus composition of Ge_(1-x)Si_x solid solutions with a low Si content (x<0.3) to gain an insight into the Si atoms arrangement in the Ge lattice and the effects of fine interaction of Ge and Si atoms in these materials. The data yielded by a through analysis of the behavior of the spectral lines corresponding to the vibrations of Ge-Ge and Ge-Si atomic bonds revealed some peculiar features. We discuss here the absence of high-frequency shift and broadening of the Ge-Ge local vibrations in ur Ge_(1-x)Si_x solid solution samples. We have also studied the splitting effect of the Ge-Si line into two branches and suggested some explanation of this result.
机译:已经研究了拉曼光谱线的幅度,形状和位置与低Si含量(x <0.3)的Ge_(1-x)Si_x固溶溶液组成,以获得Ge格子中的Si原子的洞察 Ge和Si原子在这些材料中的精细相互作用的影响。 通过分析对应于Ge-Ge和Ge-Si原子键的振动的谱线行为的分析产生的数据揭示了一些特殊的特征。 我们在这里讨论了缺乏高频移位和扩大UR GE_(1-x)Si_x固体解决方案样本中的GE-GE局部振动。 我们还研究了GE-Si线的分裂效果分为两个分支,并建议对此结果的一些解释。

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