Design of Analog Test Hardware Platform Based on IEEE 1149.4

摘要

IEEE 1149.4 infrastructure has provided effective solutions for the boundary scan test of the mixed-signal circuit. For the analog testing, the boundary-scan test for mixed signal is very important as well as difficult, since there is no commercialized automatic test equipment up to now. This paper analyzes the standard IEEE 1149.4 test architecture and specifications, and designs an analog test hardware platform base on this standard. It provides low-cost automatic tool for analog circuit in IEEE 1149.4 environment, so as to enhance the test capability for the analog circuit. All indicators of platform meet the requirements of analog circuits in the IEEE 1149.4 environment. The measurement results are presented at the end.