Implementing Analog Testing Using IEEE 1149.1 and 1149.4

摘要

Life and death hang in the balance when we perform testing at our company. We develop tests for hybrids used by implantable cardiac management systems, so it is extremely important that the tests be comprehensive and thorough. These hybrids contain microprocessors and mixed-signal (analog and digital) integrated circuits (ICs). The digital portions of our ICs are IEEE 1149.1-compliant and support standard instruction register boundary scan instructions such as BYPASS, EXTEST, and INTEST.