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Defects Characterization of Molecular Crystal Explosives

机译:分子晶体爆炸物的缺陷表征

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The defects, such as void, dislocation, crack and roughness, play an important role in molecular crystal explosives. The accurate quantitative characterization of defects in explosive particles is vital for association of defects and sensitivity. This paper provides comprehensive information on the defects characterization of molecular crystal explosives categorized by direct and indirect techniques, including optical microscopy, SEM, AFM, XRT, micro CT, FIB, XRD, SAS, CST, MIP, BET and NQR. Some critical results for each method are presented.
机译:缺陷,如空隙,脱位,裂缝和粗糙度,在分子晶体爆炸物中发挥着重要作用。爆炸颗粒中缺陷的准确定量表征对于缺陷和敏感性至关重要。本文提供了有关通过直接和间接技术分类的分子晶体爆炸物的缺陷表征的全面信息,包括光学显微镜,SEM,AFM,XRT,Micro CT,FiB,XRD,SAS,CST,MIP,BET和NQR。提出了每个方法的一些关键结果。

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