Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
Institute of Chemical Materials,CAEP,Mianyang 621900,Sichuan,China;
Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics (CAEP),Mianyang 621900,Sichuan,China;
defects characterization; explosives; direct methods; indirect methods; RDX; HMX; CL-20;
机译:聚焦离子束纳米断层扫描表征分子晶体炸药中的孔形态
机译:UiO-66晶体中缺陷的确定分子水平表征
机译:掺假晶体缺陷对Cl-20 / TNT爆炸性能的理论研究
机译:分子晶体爆炸物的缺陷表征
机译:热点引发对分子动力学模拟的高爆炸性晶体中空洞分布的依赖性。
机译:纳米CL-20 / TNT的制备与表征机械球磨法共结晶炸药
机译:分子组装成像对有机晶体中STM /晶格缺陷影响的分子堆积效率对石墨单分子膜外延生长模式的影响(状态和结构-电子显微镜和晶体化学)
机译:爆炸物晶体的生长和缺陷。