首页> 外文会议>ICCCS international symposium on contamination control >A DISCUSSION OF VIBRATION AND NOISE ISSUES IN A CLEANROOM DESIGN: PAST, PRESENT, AND FUTURE
【24h】

A DISCUSSION OF VIBRATION AND NOISE ISSUES IN A CLEANROOM DESIGN: PAST, PRESENT, AND FUTURE

机译:讨论洁净室设计中的振动和噪声问题:过去,现在和未来

获取原文

摘要

Semiconductor manufacturing processes have evolved dramatically over the past fifteen years or so. Process technologies have migrated from feature sizes of about 10 microns down to 0.25 micron, consistent with the so-called "Moore's Law". Additionally, the increase in wafer size from 200 to 300 mm introduces new issues to be discussed. Vibration and noise are two important contaminants affecting semiconductor production processes. As vibration and noise consultants to this industry for the past several decades, we are challenged almost daily with questions such as: "What are the vibration requirements for the environments which are to house the present and future generation submicron processes?" "What are the requirements for the 300 mm conversion?" In this paper, we review the process tool vibration requirements in the past, the present, and the future. We discuss vibration criteria which will need to apply to future fabrication facilities to accommodate these tools. We will elaborate on concepts which may need to be considered in the design of future facilities for yet-to-be-defined future technologies.
机译:半导体制造过程在过去的十五年左右过去发生了显着发展。过程技术已经从大约10微米的特征尺寸迁移到0.25微米,与所谓的“摩尔定律”一致。此外,晶片尺寸的增加从200到300 mm引入要讨论的新问题。振动和噪声是影响半导体生产过程的两个重要污染物。作为振动和噪音顾问在过去的几十年中,我们几乎每天都有挑战,如:“用于容纳现在和未来的亚微米流程的环境的振动要求是什么?” “300 mm转换的要求是什么?”在本文中,我们审查了过去,现在和未来的过程工具振动要求。我们讨论振动标准,需要适用于未来的制造设施以适应这些工具。我们将详细阐述可能需要在未来的未来设施设计中考虑的概念,以待定的未来技术。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号