Performance Degradation after Proton Irradiation in Charge-Coupled Devices: a Cross-device Comparison

摘要

In the context of the technology validation of Charge-Coupled Devices for Euclid and PLATO, two European Space Agency missions dedicated to Astronomy, we present a comparison between the performance degradation (dark current and charge transfer inefficiency) after proton irradiation of two types of device manufactured by e2v.