IDENTIFICATION OF AUTHENTICITY OF MICROELECTRONIC DEVICES USING RADIATION SIMULATION MODELING

机译：使用辐射仿真建模识别微电子器件的真实性

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

The article outlines a methodological approach, core specifics and capabilities of radiation identification of microelectronic devices at a specified exposure to ionizing radiation.

机译：本文概述了在特定地暴露于电离辐射的微电子器件辐射识别的方法方法，核心细节和能力。

著录项

来源
《European Conference on Radiation and its Effects on Components and Systems》|2015年||共3页
会议地点
作者
Boychenko D. V.; Ozhegin Yu. A.; Kondratyeva T. A.; Nikiforov A. Yu.; Telets V. A.;
展开▼
作者单位

展开▼
会议组织
原文格式 PDF
正文语种
中图分类 TN014-53;
关键词
Radiation identification; Ionizing radiation; Counterfeit products; Dominant radiation effects; Test exposure;

机译：辐射识别;电离辐射;假冒产品;主导辐射效应;测试曝光;

相似文献

外文文献
中文文献
专利

1. Simulation of ion beam induced current in radiation detectors and microelectronic devices [J] . Gyorgy Vizkelethy Nuclear Instruments & Methods in Physics Research . 2011,第20期

机译：辐射探测器和微电子设备中离子束感应电流的仿真
2. Guest editorial for the Special Issue on signal and power integrity of microelectronic networks through modelling and simulation of fields and devices [J] . Zadehgol Ata International journal of numerical modelling . 2018,第4期

机译：通过对场和设备的建模和仿真，发表有关微电子网络信号和功率完整性的特刊的客座社论
3. Application of a model for treatment of time dependent effects on irradiation of microelectronic devices [J] . Brown D.B., Jenkins W.C. IEEE Transactions on Nuclear Science . 1989,第6期

机译：模型对微电子器件辐照的时间依赖性效应的治疗应用
4. IDENTIFICATION OF AUTHENTICITY OF MICROELECTRONIC DEVICES USING RADIATION SIMULATION MODELING [C] . Boychenko D. V., Ozhegin Yu. A., Kondratyeva T. A., European Conference on Radiation and its Effects on Components and Systems . 2015

机译：使用辐射仿真建模识别微电子器件的真实性
5. Numerical simulation and experiments of fatigue crack growth in multi-layer structures of MEMS and microelectronic devices. [D] . Wang, Bo. 2007

机译：MEMS和微电子器件多层结构中疲劳裂纹扩展的数值模拟和实验。
6. Quantum transport simulations of graphene nanoribbon devices using Dirac equation calibrated with tight-binding π-bond model [O] . Sai-Kong Chin, Kai-Tak Lam, Dawei Seah, 2012

机译：使用紧密结合的π键模型校准的Dirac方程对石墨烯纳米带器件的量子输运模拟
7. Guest editorial for the Special Issue on signal and power integrity of microelectronic networks through modelling and simulation of fields and devices [O] . Ata Zadehgol 2018

机译：通过建模和仿真，微电子网络信号和电源完整性的特殊问题
8. Simulation of Ion Beam Induced Current in Radiation Detectors and Microelectronic Devices [R] . Bizkelethy, G. 2009

机译：辐射探测器和微电子器件中离子束感应电流的模拟

IDENTIFICATION OF AUTHENTICITY OF MICROELECTRONIC DEVICES USING RADIATION SIMULATION MODELING

摘要

著录项

相似文献

相关主题

期刊订阅