General design principles of self-testing code-disjoint PLAs

摘要

This paper presents general principles of designing self-testing (ST) code-disjoint (CD) PLAs under fault model which covers three classes of typical PLA faults. It is assumed that both inputs and outputs of a PLA are encoded with an unordered code and that PLAs are inverter-free. It is shown that the necessary condition for ST and CD is that the input code of a PLA is closed. The formal conditions for the existence of a one- and multi-stage ST and CD PLA are formulated. The new PLA-based self-testing checkers for various closed unordered codes are less complex and/or faster than existing designs, and for some unordered codes they are the first ever proposed. An important property of all new designs is that they are all single crosspoint irredundant.