DCScan: A Power-Aware Scan Testing Architecture

摘要

This paper proposes a novel power-aware scan architecture: DCScan. In this architecture, the compatible scan cells are grouped into the same segment. Test data propagation in DCScan includes two parts: data copying and data shifting. There is no scan shift-in transition during data copying. Experimental results show our approach can achieve low test power, low wiring overhead and low test response data volume.