assembling; ball grid arrays; integrated circuit packaging; integrated circuit reliability; solders; surface finishing; PBGA Assemblies; ball grid array; drop reliability; impact reliability; solder ball; solder joints; surface finish; surface mount packages;
机译:在温度和湿度测试下,具有ENIG和ENEPIG表面光洁度的含环氧树脂的Sn-58 wt。%Bi焊点的跌落可靠性
机译:ENIG表面光洁度中添加Pd对Sn-Ag-Cu焊点跌落可靠性的影响
机译:热电耦合可靠性试验后ENIG / CU-COSE SAC305 / ENIG焊点的相位识别和界面演化
机译:用SAC305,SAC105和SAC105-Ni焊球对PBGA组件的降低可靠性研究Cu-OSP和ENIG表面光洁度
机译:塑料球栅阵列(PBGA)和底铅塑料(BLP)组件的焊点可靠性。
机译:锡膏合金的可靠性研究以改善表面安装细间距元件的焊点
机译:热增强FC-PBGA组件焊球可靠性研究