Resistors have several applications in high frequency circuits including uses in attenuators, terminations, and power dividers among others. To date, there has been very little attempt to characterize embedded resistor performance on organics above 18 GHz. In this paper, RF measurements of embedded thin film resistors up to 40 GHz are presented on a liquid crystal polymer (LCP) substrate using a commercially available laminated foil to form the thin film NiCrAlSi resistors. Measurements have been demonstrated to be accurate to 5% of their simulated values across the frequency band.
展开▼
