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An Iterative Inverse Method For Ellipsometric Determination Of Optical Constants And Thickness Of L-B Film

机译：椭圆型椭圆型测定光学常数的迭代逆方法及L-B膜的厚度

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《Annual International Conference of the IEEE Engineering in Medicine and Biology Society》|1990年||共2页
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Yu Wei; Rong Zhu; Institute of Electric and Electronic Engineer;
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中图分类自动化技术、计算机技术;
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1. Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method [J] . Evmenova AZ, Odarych VA, Sizov FF, Optica applicata . 2008,第3期

机译：椭偏法测定吸收性CdTe薄膜的光学参数和膜厚
2. Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method [J] . Anna Z. Evmenova, Fedir F. Sizov, Mykola V. Vuichyk, Optica applicata . 2008,第3期

机译：椭偏法测定吸收性CdTe薄膜的光学参数和膜厚
3. Ellipsometric determination of anisotropic optical constants of single phase Ga_2O_3 thin films in its orthorhombic and monoclinic phases [J] . Zhao Minglin, Tong Rongjing, Chen Xuanhu, Optical Materials . 2020,第Apra期

机译：椭型措施测定在其正交和单晶体相中单相Ga_2O_3薄膜的各向异性光学常数
4. An Iterative Inverse Method For Ellipsometric Determination Of Optical Constants And Thickness Of L-B Film [C] . Yu Wei, Rong Zhu, Ci Lin Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE . 1990

机译：椭偏的迭代逆方法测定L-B膜的光学常数和厚度
5. Novel methods for determining the optical constants of anisotropic polymer films: New application of prism wave-guide coupling. [D] . Liu, Tao. 2002

机译：确定各向异性聚合物薄膜光学常数的新方法：棱镜波导耦合的新应用。
6. Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method [O] . Junbo Gong, Rucheng Dai, Zhongping Wang, -1

机译：银纳米薄膜表面等离激元的厚度色散：透射法迭代椭偏法测定。
7. Ellipsometric Measurement of Optical Constants and Thickness of Passive Films Formed on 18ndash;8 Stainless Steel [O] . Shiro Matsuda, Katsuhisa Sugimoto, Yoshinobu Sawada 1977

机译：在18-8不锈钢中形成的光学常数和无源膜厚度的椭圆测量
8. Iterative Inverse Radiative Transfer Method to Estimate Optical Thickness andSurface Albedo [R] . Sanchez, R., McCormick, N. J., Yi, H. C. 1990

机译：迭代反辐射传递法估算光学厚度和表面反照率

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