首页> 外文会议>Design Automation, 1995. DAC '95. 32nd Conference on >Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuitsy
【24h】

Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuitsy

机译:VLSI电路中的极端延迟灵敏度和最坏情况下的切换活动

获取原文

摘要

We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, slight delay variations can lead to several orders of magnitude changes in the node activity. This has important implications for CAD in that, if the transition density is estimated by simulation, then minor inaccuracies in the timing models can lead to very large errors in the estimated activity. As a solution, we propose an efficient technique for estimating an upper bound on the transition density at every node. While it is not always very tight, the upper bound is robust, in the sense that it is valid irrespective of delay variations and modeling errors. We will describe the technique and present experimental results based on a prototype implementation.
机译:我们观察到,电路节点处的开关活动(也称为过渡密度)对电路内部延迟非常敏感。结果,轻微的延迟变化可能导致节点活动数个数量级的变化。这对CAD具有重要意义,因为如果通过模拟估算过渡密度,则时序模型中的微小误差会导致估算活动中的很大误差。作为解决方案,我们提出了一种有效的技术,用于估算每个节点上的过渡密度的上限。尽管上限并不总是很紧,但从延迟意义和建模误差的角度来看,上限是有效的,从某种意义上说,上限是可靠的。我们将描述该技术并在原型实现的基础上提供实验结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号