首页> 外文会议>Indium Phosphide and Related Materials, 2001. IPRM. IEEE International Conference On >Molecular beam epitaxial growth and characterization ofGaAs0.5Sb0.5 layers on (111)B InP substrates
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Molecular beam epitaxial growth and characterization ofGaAs0.5Sb0.5 layers on (111)B InP substrates

机译:分子束外延生长及表征(111)B InP衬底上的GaAs 0.5 Sb 0.5

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摘要

GaAs0.5Sb0.5 layers were grown on (111)Boriented InP substrates by molecular beam epitaxy (MBE). It was foundthat the Sb mole fraction of the (111) samples is higher than that of(100) samples. Furthermore, the band gap energy of the (111) sample wasfound to be larger than that of the (100) sample from photoluminescenceand optical absorption measurements. The mechanism of the band gapenergy shift was discussed based on the spontaneous ordering of alloys
机译:在(111)B上生长GaAs 0.5 Sb 0.5 层 分子束外延(MBE)定向InP衬底。它被找到了 (111)样品的Sb摩尔分数高于 (100)个样本。此外,(111)样品的带隙能为 从光致发光中发现大于(100)个样品 和光吸收测量。带隙的机理 基于合金的自发有序性讨论了能量转移

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