首页> 外文会议>Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual >An improved MMIC design system composed of an electron beam directdrawing, microwave simulation and on-wafer measurement subsystems
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An improved MMIC design system composed of an electron beam directdrawing, microwave simulation and on-wafer measurement subsystems

机译:由电子束直接构成的改进的MMIC设计系统绘图,微波仿真和晶圆上测量子系统

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An improved design system is introduced to develop not only newmonolithic microwave ICs (MMICs) and their element devices, but alsotheir accurate simulation models. It is composed of electron beam (EB)direct drawing, microwave simulation, and on-wafer measurementsubsystems connected through the LAN. Successful preliminaryapplications of this system are demonstrated for improved T-shaped 0.1μm length gate formation and an amplifier designed using thisimproved simulation model. The system and its advantages are described
机译:引入了改进的设计系统,不仅可以开发新的 单片微波集成电路(MMIC)及其元件设备,而且 他们精确的仿真模型。它由电子束(EB)组成 直接绘图,微波模拟和晶圆上测量 通过局域网连接的子系统。成功的初步 演示了该系统的应用,以改进T形0.1 长度为μm的栅极结构以及使用该栅极结构设计的放大器 改进的仿真模型。描述了该系统及其优点

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