首页> 外文会议>Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International >A new approach to implement 0.1 μm MOSFET on thin-film SOIsubstrate with self-aligned source-body contact
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A new approach to implement 0.1 μm MOSFET on thin-film SOIsubstrate with self-aligned source-body contact

机译:在薄膜SOI上实现0.1μmMOSFET的新方法具有自对准源体接触的基板

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An alternative approach was used to optimize SOI MOSFET forsubquarter micron channel length. It involves a direct transfer of theoptimized bulk Si structure to SOI substrate with film thickness of⩾100 nm. Since the device is operating in non-fully depleted mode,floating body effect has to be eliminated. This is accomplished througha novel self-aligned asymmetric source-body contact in which the currentconducts through tunneling. Test structures have been fabricated andgood electrical results were obtained
机译:替代方法用于优化SOI MOSFET 次级变微米通道长度。它涉及直接转移 具有膜厚度的SOI基板优化的散装Si结构 ⩾ 100 nm。由于设备以非完全耗尽模式运行,因此 必须消除浮体效应。这是通过的 一种新型自我对齐的不对称源体 - 主体接触,其中电流 通过隧道进行。测试结构已制造和 获得了良好的电气结果

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