Analysis of ISSQ/IDDQ testing implementation and circuitpartitioning in CMOS cell-based design

摘要

Difference between ISSQ and IDDQ testing strategies is presented,discussing the dependency of area overhead and sensing speed on thetechnology. The current sensor implementation style suitable forcell-based design methodology or semi-custom design style is proposedExperimental results for each strategy are discussed. Finally, differenttypes of partitioning strategies are showed, taken into account theparallelism of the gates