Test head design using electrooptic receivers and GaAs pinelectronics for a gigahertz production test system

摘要

A test head subsystem providing ultrahigh-speed digital signalpaths to a device under test is introduced and described. The test headhouses liquid-cooled GaAs pin electronics capable of NRZ(non-return-to-zero) data rates up to 1.2 Gb/s. A novel test systemreceiver scheme utilizing an electrooptic (laser) measurement method isdescribed which captures pin information by connecting the device undertest (DUT) to a laser scanned optical sensor assembly having multipletest points. The receiver has a 4.5-GHz bandwidth and can perform ECL(emitter-coupled logic) level functional test with one sampling pulseper vector. Using transmission line theory and advanced interconnectiontechnology, a device environment was design which supports signalbandwidth approaching 5 GHz to connect the GaAs drivers, electroopticreceivers, and the DUT