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New developments in single pass reflow encapsulant for flip chipapplication

机译:倒装芯片单程回流密封剂的新发展应用

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This paper introduces a series of single pass reflow encapsulantsthat requires no post curing after solder bump reflow. Acting as a fluxand an encapsulant, this product performs two functions. First, thematerial activates the solder bump and metallic bond pad during solderreflow to establish the interconnection between the die and substrate.Second, while this material is being cured, it forms a mechanical bondbetween the surface of the die and substrate. This product allowsprocessing normal surface mount component packages concurrently withflip chip, CSPs or BGAs under the standard surface mount reflow-profile.Such a process eliminates capillary underfilling and curing time. Theproduct's solderability is robust and high yield; the parts are reliableafter thermal shock testing. We have employed DSC, TMA, DMA and sheartest techniques to investigate the properties of the material. Theseproperties include influence of filler loading level, curing reflowprofile, percentage cure, glass transition temperature (Tg), coefficientof thermal expansion (CTE), modulus and die shear adhesion
机译:本文介绍了一系列单程回流密封剂 焊料凸点回流后无需后固化。充当助焊剂 和一种密封剂,该产品具有两种功能。首先, 材料在焊接过程中激活焊料凸块和金属焊盘 回流以建立管芯和基板之间的互连。 其次,在固化该材料时,它会形成机械结合 在芯片表面和基板之间。该产品允许 同时处理普通的表面贴装组件封装 标准表面贴装回流焊曲线下方的倒装芯片,CSP或BGA。 这样的过程消除了毛细管的底部填充和固化时间。这 产品的可焊性强且产量高;零件可靠 经过热冲击测试。我们已经采用了DSC,TMA,DMA和剪切机 测试技术以研究材料的特性。这些 性质包括填料用量,固化回流的影响 轮廓,固化百分比,玻璃化转变温度(Tg),系数 膨胀(CTE),模量和模切剪切粘附力的关系

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