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A fluxless Sn-In bonding process achieving high remeltingtemperature

机译:无熔剂锡铟键合工艺,实现高度重熔温度

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In this paper, we report a new alternative to the conventionalsolder. It is based on In-Sn multilayer composite design. This is afluxless, oxidation-free, and most important of all, a non-eutecticsoldering technique that can achieve a remelting temperaturesignificantly higher than the bonding temperature. The In-Snnon-eutectic multilayer alloy so designed has the composition of 13.9atomic% In and 86.1 atomic% Sn. The SEM and EDX analyses performed onthe joint cross section clearly indicate a uniform joint thickness of 9μm, while the joint microstructure is clearly visible and nearlyvoid-free. The EDX results obtained also successfully demonstrate thatthe entire joint is heavily Sn-rich, as anticipated. The remeltingtemperature of several joints was analysed. It ranges from 175 to190° C, The results clearly show that the joint composition isheavily Sn-rich, a very significant advantage from which it maximizesthe temperature tolerance the device package can possibly handle
机译:在本文中,我们报告了一种替代常规方法的新方法 焊接。它基于In-Sn多层复合材料设计。这是一个 无助熔剂,无氧化,最重要的是非共晶 可以达到重熔温度的焊接技术 明显高于粘合温度。 In-Sn 如此设计的非共晶多层合金的成分为13.9 原子%In和86.1原子%Sn。进行SEM和EDX分析 接头横截面清楚地表明接头厚度均匀为9 微米,而关节的微结构清晰可见,几乎 无空的。获得的EDX结果也成功证明了 如预期的那样,整个接头富含锡。重熔 分析了几个关节的温度。范围从175到 190°C,结果清楚地表明接头成分为 锡含量高,这是其最大优势的最大优势 设备包装可能处理的温度公差

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