首页> 外文会议>Electronic Components and Technology Conference, 1991. Proceedings., 41st >Crack initiation and growth during low cycle fatigue of Pb-Snsolder joints
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Crack initiation and growth during low cycle fatigue of Pb-Snsolder joints

机译:Pb-Sn低周疲劳时的裂纹萌生与扩展焊点

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The initiation and growth of fatigue cracks during low-cyclefatigue of Pb-Sn solder joints (60Sn-40Pb and 75Sn-25Pb) in shear at 300K were followed employing two techniques: (a) surface examination bylow-power optical microscopy and (b) liquid N2 cracking offatigued specimens. Cracks 50 to 100 μm long were first detected bythe optical microscopy examination of the specimen surface at thebeginning of Stage II of the load drop parameter Φ vs. N curve.These cracks then grew as the specimen was cycled further into Stage II.SEM fractographs of fatigued specimens broken after immersion in liquidN2 revealed that fatigue cracks initiated mainly at theexternal surface and at the internal voids and grew by cracking alongall three of the common paths: eutectic colony boundaries, grainboundaries, and across the colonies, i.e., a transgranular path. Thedrop in load which occurred during the fatigue test was established tobe proportional to the fatigue cracked area
机译:低周疲劳裂纹的萌生和扩展 300剪切下Pb-Sn焊点(60Sn-40Pb和75Sn-25Pb)的疲劳 K采用以下两种技术:(a)表面检查 低倍光学显微镜和(b)液态N 2 开裂 疲劳的标本。首先通过以下方法检测到50至100μm长的裂缝 光学显微镜检查标本表面 负荷下降参数Φ与N曲线的第二阶段的开始。 这些裂纹随后随着样本进一步循环进入第二阶段而扩大。 浸入液体后破裂的疲劳试样的SEM断口扫描仪 N 2 揭示了疲劳裂纹的产生主要是在 外表面和内部空隙,并随着裂纹的发展而增长 这三种共同的路径:共晶菌落边界,籽粒 边界和跨殖民地,即沿粒间路径。这 确定在疲劳测试过程中发生的载荷下降为 与疲劳裂纹面积成正比

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