首页> 外文会议>Electronic Components and Technology Conference, 1991. Proceedings., 41st >Crack initiation and growth during low cycle fatigue of Pb-Sn solder joints
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Crack initiation and growth during low cycle fatigue of Pb-Sn solder joints

机译:Pb-Sn焊点低周疲劳时的裂纹萌生和扩展

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The initiation and growth of fatigue cracks during low-cycle fatigue of Pb-Sn solder joints (60Sn-40Pb and 75Sn-25Pb) in shear at 300 K were followed employing two techniques: (a) surface examination by low-power optical microscopy and (b) liquid N/sub 2/ cracking of fatigued specimens. Cracks 50 to 100 mu m long were first detected by the optical microscopy examination of the specimen surface at the beginning of Stage II of the load drop parameter phi vs. N curve. These cracks then grew as the specimen was cycled further into Stage II. SEM fractographs of fatigued specimens broken after immersion in liquid N/sub 2/ revealed that fatigue cracks initiated mainly at the external surface and at the internal voids and grew by cracking along all three of the common paths: eutectic colony boundaries, grain boundaries, and across the colonies, i.e., a transgranular path. The drop in load which occurred during the fatigue test was established to be proportional to the fatigue cracked area.
机译:采用两种技术跟踪Pb-Sn焊点(60Sn-40Pb和75Sn-25Pb)在300 K剪切下的低周疲劳过程中疲劳裂纹的萌生和扩展:(a)通过低功率光学显微镜进行表面检查;以及(b)液态N / sub 2 /疲劳试样开裂。首先在载荷下降参数phi vs. N曲线的第二阶段开始时通过光学显微镜检查样本表面,检测出50至100μm长的裂缝。这些裂纹随后随着样本进一步循环进入第二阶段而扩大。浸入液体N / sub 2 /中后破裂的疲劳试样的SEM断口扫描仪显示,疲劳裂纹主要在外表面和内部空隙处产生,并通过沿所有三个常见路径的裂纹而扩展:共晶菌落边界,晶界和晶界。跨殖民地,即穿越粒状路径。疲劳试验期间发生的载荷下降被确定为与疲劳裂纹面积成比例。

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