2O Metal/BaTiO<inf>3</inf>/<tex>$eta$</tex>-Ga<inf>2</inf>O<inf>3</inf> Dielectric Heterojunction Diode with 5.6 MV/cm Breakdown Field
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Metal/BaTiO3/$eta$-Ga2O3 Dielectric Heterojunction Diode with 5.6 MV/cm Breakdown Field

机译:金属/ Batio 3 / -GA 2 O 3 电介质异质结二极管,5.6 mV / cm故障领域

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β-Ga2O3 is an emerging ultra-wide bandgap (~4.7 eV) semiconductor with great potential for power electronics. The large breakdown electric field (6-8 MV/cm predicted) due to wide band gap combining with electron mobility of 250 -300 cm2/Vs offers a higher figure of merit for power electronic than SiC and GaN. In the absence of a p-type dopant, the low Schottky barrier height is a fundamental challenge for achieving the theoretically predicted limit for β-Ga2O3 power electronic devices. β-Ga2O3 Schottky barrier diodes with more than 1 kV breakdown voltage have been demonstrated but the maximum breakdown field in these devices was limited below 3.5 MV/cm due to metal to Ga2O3 Schottky barrier height (1.5-1.7 eV). In this work, we design and demonstrate the use of high dielectric heterojunctions to engineer electrostatics and transport within the diode and achieve high breakdown electric field (5.6 MV/cm) in a metal/BaTiO3 β-Ga2O3 heterojunction diode. This is the highest reported breakdown field for any β-Ga2O3 vertical diode, and it provides a general framework for future design of unipolar high voltage diodes based on wide and ultra-wide bandgap semiconductors.
机译:β-GA 2 O. 3 是一种新兴的超宽带隙(〜4.7 ev)半导体,具有很大的电力电子设备。由于宽带隙相组合的电流为250 -300厘米的宽带隙,大击穿电场(预测) 2 / Vs提供比SiC和GaN的电力电子产品更高的优点。在没有p型掺杂剂的情况下,低肖特基势垒高度是实现β-GA的理论上预测的限制的根本挑战 2 O. 3 电力电子设备。 β-GA 2 O. 3 已经证明了具有超过1kV击穿电压的肖特基屏障二极管,但由于金属至Ga,这些器件中的最大击穿场受低于3.5 mV / cm的限制 2 O3肖特基势垒高度(1.5-1.7eV)。在这项工作中,我们设计并展示了使用高介电异质功能在二极管内的工程静电和运输,并在金属/ BATIO中实现高击穿电场(5.6mV / cm) 3 β-GA 2 O. 3 异结二极管。这是任何β-GA的最高报告的故障领域 2 O. 3 垂直二极管,它为基于宽和超宽的带隙半导体的单极高压二极管进行了一般框架。

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