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Room temperature bonding of smooth Au surface of electroformed Cu substrate in atmospheric air

机译:大气中电铸铜基板光滑金表面的室温粘接

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A Cu-based heat spreader with smooth Au bonding film was fabricated by electroforming for room temperature bonding with electronic device in atmospheric air. The Cu substrates were electroformed using Au/Cu (bottom to top) and Au/Ta/Cu seed layers deposited onto smooth thermally-oxidized Si wafers; next, they were exfoliated at the Au/SiO2 interface. The exfoliated Au surface was bonded with the surface of Au-metallized Si chip at room temperature in atmospheric air by the surface activated bonding method. The Cu substrate electroformed using Au/Cu layer was poorly bonded because Cu atoms diffused through the Au film formed CuO on the surface. In the case of the Au/Ta/Cu seed layer, however, the Cu substrate was strongly bonded because the diffusion of Cu was blocked by the Ta barrier layer. It is expected that this technique will contribute to direct bonding between semiconductor device and heat spreader at room temperature without the use of vacuum bonding equipment.
机译:通过电铸以与大气中的电子器件进行室温粘合,制造出具有光滑Au粘合膜的Cu基散热器。使用Au / Cu(从下到上)和沉积在光滑的热氧化Si晶片上的Au / Ta / Cu籽晶层对Cu基板进行电铸;接下来,它们在Au / SiO处剥落 2 界面。剥离的Au表面在室温下在大气中通过表面活化键合方法与Au金属化的Si芯片的表面键合。使用Cu / Cu层电铸的Cu基板的结合不良,因为Cu原子扩散通过在表面上形成CuO的Au膜而扩散。然而,在Au / Ta / Cu籽晶层的情况下,由于Ta的阻挡层阻止了Cu的扩散,因此Cu衬底牢固地结合在一起。预期该技术将有助于在不使用真空接合设备的情况下在室温下半导体器件和散热器之间的直接接合。

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