...
首页> 外文期刊>Microelectronic Engineering >Replication of atomically smooth surface shape onto electroplated Au patterns by lift-off process and room-temperature Au-Au bonding in atmospheric air
【24h】

Replication of atomically smooth surface shape onto electroplated Au patterns by lift-off process and room-temperature Au-Au bonding in atmospheric air

机译:通过剥离工艺和大气中的室温Au-Au键将原子光滑的表面形状复制到电镀Au图案上

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We demonstrate a newly-developed process for replicating a surface shape of an atomically smooth master substrate onto electroplated Au patterns by a lift-off process using a thin sacrificial layer. In this process, a Ti sacrificial layer and a thin Au seed layer were first deposited on the master substrate. Sealing ring patterns were then formed using a combination of photolithography and Au electroplating. These patterns were next bonded to a Au thin film on a Si wafer. Finally, by chemically dissolving the Ti sacrificial layer, the patterns were released from the master substrate and transferred to the Si wafer. The resulting patterns had an atomically smooth surface with a root-mean-square surface roughness of 0.8 nm. To examine applicability of the smooth Au surface to Au-Au direct bonding, these smooth patterns were bonded to another Au-coated Si wafer at room temperature in atmospheric air, and tensile tests were carried out. A high bonding strength of about 250 MPa was obtained, with fracture eventually occurring within the Si substrate.
机译:我们演示了一种新开发的工艺,该工艺通过使用薄牺牲层的剥离工艺将原子光滑的主基板的表面形状复制到电镀的Au图案上。在此过程中,首先在主基板上沉积Ti牺牲层和Au种子层。然后使用光刻和金电镀的组合形成密封环图案。接下来,将这些图案结合到Si晶片上的Au薄膜上。最后,通过化学溶解Ti牺牲层,将图案从主基板上释放并转移到Si晶片上。所得图案具有原子光滑表面,且均方根表面粗糙度为0.8nm。为了检验光滑的Au表面对Au-Au直接键合的适用性,在室温下在大气中将这些光滑的图案键合到另一个Au涂层的Si晶片上,并进行了拉伸试验。获得了约250 MPa的高结合强度,最终在Si基板内发生了断裂。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号