首页> 外文会议>SOI-3D-Subthreshold Microelectronics Technology Unified Conference >Super steep subthreshold slope PN-body tied SOI FET's of ultra low drain voltage=0.1V with body bias below 1.0V
【24h】

Super steep subthreshold slope PN-body tied SOI FET's of ultra low drain voltage=0.1V with body bias below 1.0V

机译:超陡峭的亚阈值斜率PN体绑定SOI FET,超低漏极电压= 0.1V,体偏置低于1.0V

获取原文

摘要

It was demonstrated that the body bias appearing the super steep Subthreshold Slope (SS) reduces from over 5V to below 1V on the PN-body tied SOIFET's which show the super steep SS with the ultralow drain voltage of 0.1V, when the impurity concentration of the N region on the body tied area is redesigned from the high concentration of the N+ to the low N-. The 3D device simulations also confirmed it and indicated that the optimum length of the N region exits on the different impurity concentration of it for appearing the super steep SS with the low body bias.
机译:结果表明,在PN体连接的SOIFET上,出现超陡亚阈值斜率(SS)的体偏置从超过5V降低到1V以下,当杂质浓度为0.1V时,SOIFET显示超陡SS具有极低的漏极电压。从高浓度的N +到低浓度的N-重新设计了身体束缚区域上的N区域。 3D器件仿真也证实了这一点,并指出,N区域的最佳长度取决于其不同的杂质浓度,从而出现了具有低体偏的超陡SS。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号