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All digital phase locked loop with input clock fail detector

机译:具有输入时钟故障检测器的全数字锁相环

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All Digital Phase Locked Loops are widely used as clock generators in multiprocessor system on chips. An error detection system is crucial for such clock generators since it can be used to notify different processors to shut down so as to prevent the propagation of a faulty clock. In this work, an All Digital Phase Locked Loop with an improved input clock failure detector is presented. The All Digital Phase Locked Loop proposed in this paper is designed to operate from 61KHz to 42Mhz. A completely digital approach is used for the design. The design achieves lock in less than 5 reference cycles. The input clock fail detector circuit detects the loss of input signal and notifies the controller. Fault detection is possible at an early stage and hence, it takes only 2 Digitally Controlled Oscillator clock cycles for stuck at fault detection and 1 reference clock cycle for out of limit fault detection. Entire design is done in Verilog hardware description language and hence it is highly versatile. Synthesis is done using cadence RTL compiler.
机译:所有数字锁相环被广泛用作片上多处理器系统中的时钟发生器。错误检测系统对于这种时钟发生器至关重要,因为它可以用于通知不同的处理器关闭,以防止错误时钟的传播。在这项工作中,提出了具有改进的输入时钟故障检测器的全数字锁相环。本文提出的全数字锁相环设计工作在61KHz至42Mhz的频率范围内。设计使用完全数字化的方法。该设计可在不到5个参考周期内实现锁定。输入时钟故障检测器电路检测输入信号的丢失并通知控制器。故障检测可以在早期进行,因此,停留在故障检测上只需要2个数字控制振荡器时钟周期,而超出极限故障检测只需要1个参考时钟周期。整个设计都是使用Verilog硬件描述语言完成的,因此具有高度的通用性。综合使用cadence RTL编译器完成。

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