Prediction of aging impact on electromagnetic susceptibility of an operational amplifier

机译：预测老化对运算放大器电磁敏感性的影响

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This paper deals with the impact of aging on the electromagnetic susceptibility level of a CMOS operational amplifier (opamp). The aging impact can be modelled by the variation of several parameters of the MOSFET model, to predict the evolution of electromagnetic susceptibility (EMS) of the opamp block during the aging process.

机译：本文涉及老化对CMOS运算放大器（Opamp）的电磁敏感水平的影响。可以通过MOSFET模型的若干参数的变化来建模老化的影响，以预测在老化过程中opamp块的电磁敏感性（EMS）的演变。

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《Asia-Pacific Symposium on Electromagnetic Compatibility》|2015年|86-89|共4页
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Huang He; Boyer Alexandre; Ben Dhia Sonia; Vrignon Bertrand;
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Prediction of aging impact on electromagnetic susceptibility of an operational amplifier

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