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机译:中子引起的位移损伤
CEA (Gramat),Commissariat à l’Energie Atomique et aux Energies Alternatives, Gramat, France;
Degradation; Electric variables measurement; Integrated circuit modeling; Operational amplifiers; Performance evaluation; Radiation effects; Single event transients; Transient response; Bipolar analog integrated circuits; X-ray effects; circuit modeling; displacement damage; total non-ionizing dose; transient radiation effects; transient response;
机译:LM124运算放大器中TID对ATREE响应影响的研究和建模
机译:TID与ATREE协同作用对LM124运算放大器响应的影响研究
机译:剂量率转换辐射对LM124运算放大器对脉冲X射线响应的影响
机译:研究制造差异对LM124运算放大器中TID-ATREE协同效应的影响
机译:基于振动的损伤检测,具有新的操作响应和波形分析方法
机译:在运行和环境条件下利用压电传感器进行冲击损伤定位
机译:低剂量率电离辐射对LM124运算放大器中瞬态形状的影响