Fault Diagnosis in a Class of concurrent dischrete event systems

摘要

In this paper, we consider diagnosability of discrete event systems with simultaneous event occurrences, which we call concurrent discrete event systems. The systems have a problem that the number of event sets which may occur concurrently is increasing exponentially. So it is difficult to design a diagnoser. We introduce a notion of concurrent well-posedness(CWP). We then prove that CWP is a necessary and sufficient condition for no effect of concurrency on the diagnosability in concurrent discrete event systems.