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Nonlinear Quantization for In-Sram Multi-Bit MAC Design

机译:用于SRAM中的非线性量化,多比特MAC设计

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In-memory computing arises as a novel computing paradigm aiming to overcome the memory wall bottleneck present in the conventional von Neumann architecture. By integrating the computation within the memory array, i.e., 6T CMOS SRAM array, in-memory computing blocks reduce the time- and energy-consuming data movement between the storage and processing cores, thus improving the energy efficiency and performance. Prior work [1] has focused on realizing the multi-bit multiplication and accumulation (MAC) in-memory operation by quantizing the analog discharge behavior associated with the SRAM bit cell. However, prior work realizes the multi-bit quantization by assuming that the discharge rate is linear to input voltage given a discharge interval. Such overlooking of the discharge nonlinearity associated with SRAM may hinder the design from practical multi-bit quantization. In this paper, we analyze the nonlinearity effect of the SRAM bit cell discharge and propose three optimization guidelines to address the challenges caused by nonlinear discharge. Simulation results validate our proposed methods.
机译:内存计算是作为一种新颖的计算范例,其旨在克服传统的von Neumann架构中存在的记忆墙瓶颈。通过将计算集成在存储器阵列中,即6T CMOS SRAM阵列,内存计算块减少了存储和处理核之间的时间和能量消耗数据移动,从而提高了能量效率和性能。通过量化与SRAM位小区相关联的模拟放电行为来实现先前的工作[1]专注于实现多位乘法和累积(MAC)内存运行。然而,先验工作通过假设放电速率是线性的,以给出放电间隔的输入电压来实现多比特量化。与SRAM相关联的放电非线性的这种俯视可能会阻碍设计从实际的多比特量化。在本文中,我们分析了SRAM比特小区放电的非线性效应,并提出了三种优化指南来解决非线性放电引起的挑战。仿真结果验证了我们所提出的方法。

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