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Plasmon Spectra at Wurtzite Aluminum Gallium Nitride / Silicon Carbide Heterojunctions

机译:纤锌矿氮化铝镓/碳化硅异质结处的等离子光谱

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We present theoretical calculations for electron plasmon spectra at wurtzite Aluminum Gallium Nitride/ Silicon Carbide heterojunctions. Spontaneous and piezoelectric polarizations in wurtzite semiconductors give rise to polarization discontinuities at interfaces and to bound interface sheet charges. These charges are of the order of 1013 electrons per cm2 and give rise to two dimensional electron or hole gases near heterojunctions. Electron-electron interactions in the two-dimensional electron gases give rise to collective plasmon excitations. We calculate the dielectric function in these electron gases under the well-known and widely studied random phase approximation. Our calculations are relevant to the determination of the plasmon spectra at wurtzite Aluminum Gallium Nitride / Silicon Carbide heterojunctions and are of potential interest for determining the limits of mobility in two-dimensional electron gases. They are also of interest for terahertz electronics applications.
机译:我们介绍了纤锌矿型氮化铝镓/碳化硅异质结的电子等离激元光谱的理论计算。纤锌矿型半导体中的自发极化和压电极化会导致界面处的极化不连续性和界面板结合电荷的增加。这些电荷的数量级为每平方厘米1013个电子,并在异质结附近产生二维电子或空穴气体。二维电子气中的电子-电子相互作用引起集体等离子体激元激发。我们在众所周知的和广泛研究的随机相位近似下计算这些电子气体中的介电函数。我们的计算与确定纤锌矿型氮化铝镓/碳化硅异质结处的等离激元光谱有关,并且对于确定二维电子气中迁移率的极限具有潜在的意义。它们也是太赫兹电子应用的关注点。

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