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Variable Stripe Length method for optical gain measurements: Characteristic lengths

机译:可变条纹长度方法,用于光学增益测量:特征长度

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The Variable Stripe Length (VSL) method has been revealed in the last years to be a very useful tool to measure the optical gain in thin film active media [1]. Basically the sample is optically pumped with a stripe-shaped beam of variable length at constant intensity, and the intensity of the edge-emitted Amplified Spontaneous Emission (ASE) is measured as a function of the excitation stripe length (Fig. 1a). A simple fit of an appropriate expression to the resulting data gives the optical gain as an output parameter.
机译:近年来,可变条纹长度(VSL)方法已成为一种非常有用的工具,可用于测量薄膜活性介质中的光学增益[1]。基本上,将样品以恒定强度的可变长度的条形光束光学泵浦,然后测量边缘发射的自发发射(ASE)的强度作为激发条长度的函数(图1a)。对结果数据进行适当表达式的简单拟合,就可以将光学增益作为输出参数。

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