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THE DEVELOPMENT OF A 0.3MM PITCH CSP ASSEMBLY PROCESS USING STANDARD MATERIALS

机译:使用标准材料开发0.3mm间距CSP装配工艺

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As consumers, the expectation of increased functionality with reduced form factor is a given. However, the tireless demand for product efficiency is starting to stretch design for manufacture (DFM) rules. Fabricating products with decreasing feature size is not a major issue, nor is producing products that have larger components; the dilemma is when products require both.This conundrum is now upon the Surface Mount Technology (SMT) community. With the impending roll out of 0.3mm pitch CSP's pushing feature sizes below 200 microns - on assemblies still requiring large RF shields and connectors, the challenge of heterogeneous assembly is looming upon us.The main issue surrounding the stencil printing process when dealing with heterogeneous assembly is area ratio (the ratio between stencil aperture open area and aperture wall area). When complying with traditional design rules and maintaining area ratios greater than 0.661 then it becomes near impossible to design a print process for a wide mix of fine and large pitch components.To address these concerns a new squeegee printing technique has been developed. Initial laboratory trials have shown that existing area ratio rules can be seriously challenged and broken to permit 0.3mm pitch CSP assembly within a traditional SMT process without the need for any material change. Details of this new development together with substantive paste transfer efficiency data will be presented.
机译:作为消费者,人们期望增加功能性并减少外形尺寸。但是,对产品效率的不懈需求正开始扩展制造设计(DFM)规则。制造具有减小的特征尺寸的产品不是主要问题,生产具有较大部件的产品也不是主要问题。当产品同时需要两者时,就陷入了困境。表面贴装技术(SMT)社区现在面临这个难题。随着即将推出的0.3mm间距CSP推动功能尺寸低于200微米-在仍需要大型RF屏蔽和连接器的组件上,异类组装的挑战迫在眉睫。是面积比(模板孔开口面积与孔壁面积之比)。当遵守传统的设计规则并保持大于0.661的面积比时,几乎不可能设计出适用于各种细间距和大间距组件的印刷工艺。为了解决这些问题,人们开发了一种新型的刮板印刷技术。最初的实验室试验表明,现有的面积比规则可能会受到严重挑战和破坏,以允许在传统的SMT工艺中以0.3mm间距的CSP组装,而无需进行任何材料更改。将介绍此新开发的详细信息以及实质性的糊剂转移效率数据。

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