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Ge/Si Core/Shell Nanowire Structures for Tunneling Devices

机译:用于隧道器件的Ge / Si核/壳纳米线结构

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In this work, the concept of band-to-band tunneling (BTBT) devices is explored and the benefits of Ge/Si core/shell nanowire heterostructures (NWHs) as a material/geometry-related choice are discussed, namely increased performance accessible by ID material systems that operate in the quantum capacitance limit (QCL), higher tunneling currents than available to Si-based tunneling structures, and compatibility of Ge/Si platforms with current manufacturing processes. The realization of such devices requires a degenerately doped source with an atomically abrupt source/channel interface. Toward this end, we present the electrical characterization of n~+-Si shells around Ge cores that are close to the range suitable for the fabrication of optimized tunneling field effect transistors (TFETs). Specifically, we show that tuning the shell growth temperature from 470 to 600 °C has a significant impact on the morphology and transport properties of the grown Ge/Si core/shell nanowires.
机译:在这项工作中,探索了带间隧穿(BTBT)器件的概念,并讨论了Ge / Si核/壳纳米线异质结构(NWHs)作为与材料/几何形状相关的选择的好处,即可以通过以下方式提高性能:在量子电容极限(QCL)中运行的ID材料系统,比基于Si的隧穿结构可用的隧穿电流更高的隧穿电流,以及Ge / Si平台与当前制造工艺的兼容性。这种设备的实现需要具有原子突变源/通道界面的简并掺杂源。为此,我们提出了Ge核周围的n〜+ -Si壳的电学特性,该壳的范围接近适合于制造优化的隧穿场效应晶体管(TFET)的范围。具体而言,我们表明将壳的生长温度从470调节到600°C对生长的Ge / Si核/壳纳米线的形态和传输性能有重大影响。

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