首页> 外文会议>ASME InterPack conference;IPACK2009 >RESONANT TUNNELING PEAKS APPEARED IN THE CURRENT-VOLTAGE CHARACTERISTICS FOR POLYMERIC THIN FILMS
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RESONANT TUNNELING PEAKS APPEARED IN THE CURRENT-VOLTAGE CHARACTERISTICS FOR POLYMERIC THIN FILMS

机译:聚合物薄膜的电流-电压特性中出现的共振隧道峰

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Current-voltage characteristics measured with conductive-atomic force microscopy for polymeric ultrathin films are examined. The polymeric films were prepared with uv-irradiation onto Langmuir-Blodgett films deposited two layers on glass or silicon substrates. The conjugated backbone chains with alkyl side-chains are regularly arranged on the substrate surface. Anomalous current peaks were observed for many samples; and appearance depends on the film structure and interfacial properties between molecules and electrodes. In addition, the steep increase in current occurred at higher applied voltages; values of the threshold electric field were estimated from Fowler-Nordheim plot. Furthermore the resistance between the electrodes decreased with increase in the effective film thickness.
机译:检查了用导电原子力显微镜测量的聚合物超薄膜的电流-电压特性。聚合物膜通过紫外线照射在沉积在玻璃或硅基底上的两层的Langmuir-Blodgett膜上制备。具有烷基侧链的共轭主链规则地排列在基材表面上。在许多样品中观察到异常电流峰值。外观取决于膜结构和分子与电极之间的界面特性。另外,在较高的施加电压下,电流急剧增加。阈值电场的值由Fowler-Nordheim图估算得出。此外,电极之间的电阻随着有效膜厚度的增加而减小。

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